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도서명
Yield and Reliability in Microwave Circuits and System Design
저자/역자
Michael Meehan
출판사
Artech House
분야
RF 회로설계 일반
목차/설명
Oriented toward practical aspects of the microwave statistical design problem, this book shows you methods for extending the currently used design methodology in order to “design in” reliability and manufacturability. It introduces you to statistical circuit design techniques that encompass many different applications. The text concentrates on the problem of maximizing parametric yield. To verify the methods discussed it presents the results of three case studies using actual fabricated designs.
Contents: Introduction. Yield. Calculating Yield. Statistical Sensitivity. Yield Optimization. Statistical Modeling. Case Studies and Examples. Case Study 1 - .5 to 2.5 GHz MMIC Gain Block. Case Study 2 - 7 to 11 GHz Low Noise MMIC Amplifier. Balanced LNA Module. Case Study 3 - 7 to 11 GHz MMIC High Power Amplifier. Example 1 - Satellite Communications System. Conclusions. References.
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